SAIF Facilities


	SAIF Facilities Facilities available for carrying out Elemental Analysis: Speciation/free Electron Optical Gas Thermal Other the proposed R&D work in the applicant's and collaborator's institution: CHNSO Elemental Analyzer(CHNS) ICP-Mass Spectrometry(ICP-MS) radical analysis: Electron Spin Resonance Spectrometer(ESR) Nuclear Magnetic Resonance Spectrometer (NMR 600 MHz) Microscopes: Field Emission Gun-Scanning Electron Microscopes(FEG-SEM) Focused Ion Beam -Scanning Electron Microscope(FIB-SEM) High Resolution-Transmission Electron Microscope 300 kV (HR-TEM) Spectroscopy: FTIR-Imaging Systeml(FTIR-IMG) and Liquid Chromatography: Gas Chromatograph With High Resolution Mass Spectrometer(GC-HRMS) High Resolution Liquid Chromatograph Mass Spectrometer (HR-LCMS) High Resolution Liquid Chromatograph Mass Spectrometer (HR-LCMS Orbitrap) Liquid Chromatograph Mass Spectrometer (LC-MS) Analysis System: Simultaneous Thermogravimetric Analyzer(TGADTA) Differential Scanning Calorimetry(DSC) Instruments at SAIF/CRNTS: Time-of-Flight Secondary Ion Mass Spectrometer (ToF SIMS) Stylus Profilometer (STYL-PRO) Small Angle X-ray Scattering (SAXS) Atom Probe Tomography (APT) Environmental Scanning Electron Microscope (ESEM) Field Emission Gun-Transmission Electron Microscope 200 Kv(HR-TEM 200 kV) Fluorescence Spectrofluorometer (PL-VIS-NIR) Laser Raman Spectroscopy (LRS) Nano UV-VIS Photometer (NAUVVIS) Typhoon FLA 9500 biomolecular imager (TFLA) UV-Vis Spectrophotometer (UVVIS) ml Class 1000 Clean Room (class 100 work areas) with facilities for complete IC manufacturing (Optical & Beam lithography, Reactive-Ion-Etch, Deposition, Sputter, RTP, Furnace facilities) MEMS/Nanoelectronics fabrication facility AFM, STM, ESCA, XRD Dynamic light scattering system with Zeta particle meter Nanoparticle spray dryer with electro spray coating Scanning mobility particle sizer Dip Pen lithography Cell Sorter/FACS Tissue Culture room Dektak profilometer Cryo TEM, E-SEM Sample preparation for soft materials Multi-photon confocal microscope Excimer laser Micromap, Micro PIV Small angle X-ray scattering Probe stations, Low-noise measurements SEM; photoluminescence VLSI design workstations VLSI design tools Cadence, Mentor, Synopsys, Tanner, Xilinx, plus many public domain tools Simulation workstations Simulation software Medici, TSuprem, ISE-TCAD, SMC (Monte Carlo) Gaitonde Integrated Systems Laboratory Intel Microelectronics Lab TCS VLSI Design Lab Bombay is also setting up a Centre of Excellence in Nanoelectronics, as part of a Govt. of India initiative. More details about this centre facilities are available at http://www.cen.iitb.ac.in. These facilities will be available for the Nanotehnology project investigators and other faculty members at IIT Bombay.
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